Special Talk on : Alkali-containing molecular-ion SIMS: an inventive chemical approach for quantitative composition analysis of low-dimensional structures
Date: Wednesday, 7 November 2018
Time: 15.00-16.00
Venue: ISE 106, Chalerm Prakiat Building
Prof. Purushottam Chakraborty is considered as one of the World’s leading experts in ion-beam analysis of materials. He has been awarded the “Most Eminent Mass Spectrometrist of India” by the Atomic Energy Commission, Govt. of India in 2003.
His research areas include: Atomic collisions in solids, Secondary ion mass Spectrometry (SIMS), Secondary Neutral Mass Spectrometry (SNMS), Molecular ion – SIMS, X-ray and Ultra violet Photoelectron Spectroscopy (XPS/UPS), Auger Electron Spectroscopy (AES), Rutherford Backscattering Spectrometry (RBS), Ion-beam analysis of surfaces and interfaces, Ion-beam modifications of materials, Optical modifications, X-UV optics, Nonlinear Optics, Photonics and Plasmonics, Molecular Beam Epitaxy (MBE)-grown low-dimensional materials and nanostructures.
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